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  • Genetic algorithm for test pattern generator design. Automatic evolution of circuits
    Garbolino, Tomasz ; Papa, Gregor
    Source: Applied intelligence. - ISSN 0924-669X (Vol. 32, no. 2, 2010, str. 193-204)
    Type of material - article, component part
    Publish date - 2010
    Language - english
    COBISS.SI-ID - 23607079

source: Applied intelligence. - ISSN 0924-669X (Vol. 32, no. 2, 2010, str. 193-204)
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