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  • Determination of optical constants of thin amorphous silicon films by reflectance and transmittance measurements
    Čampa, Andrej, elektrotehnika ...
    Source: Proceedings (Str. 285-290)
    Type of material - conference contribution
    Publish date - 2005
    Language - english
    COBISS.SI-ID - 4990036

source: Proceedings (Str. 285-290)
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