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  • A novel facility for MBE growth and in-situ high resolution XPS characterization of III-V and II-VI semiconductor heterostructures
    Bratina, Gvido ...
    We describe a facility recently established at the TASC Laboratory in Trieste,Italy. The facility includes two molecular beam epitaxy chambers for the growth of III-V and II-VI semiconductors. The ... growth chambers are directly connected with an analysis chamber equipped with a monochromatic small-spot XPS spectrometer. We present preliminary studies of AlAs-GaAs(001) heterojunctions, which demostrate the potential of this facility for in-situ high resolution investigations of semiconductor heterostructures.
    Source: Vuoto. - ISSN 0391-3155 (Vol. 20, no. 3, 1990, str. 565-569)
    Type of material - article, component part
    Publish date - 1990
    Language - english
    COBISS.SI-ID - 91131

source: Vuoto. - ISSN 0391-3155 (Vol. 20, no. 3, 1990, str. 565-569)
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