EMC 2008 :: COBISS+

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EMC 2008

European Microscopy Congress (14 ; 2008 ; Aachen)

Type of material - proceedings of conference contributions

Publication and manufacture - Berlin ; Heidelberg : Springer, 2008

Language - english

ISBN - 978-3-540-85154-7; 978-3-540-85225-4; 978-3-540-85227-8; 978-3-540-85226-1

COBISS.SI-ID - 21961511

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Richter, Silvia | Schwedt, Alexander

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Year	Impact factor		Edition		Category		Classification
Year	JCR	SNIP	JCR	SNIP	JCR	SNIP	JCR	SNIP

Links to authors' personal bibliographies	Links to information on researchers in the SICRIS system
Richter, Silvia
Schwedt, Alexander

Source: Personal bibliographies and: SICRIS

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