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  • Rentgenska fotoelektronska spektroskopija z visoko lateralno ločljivostjo - mikro XPS
    Kovač, Janez, 1965-
    The phenomena on the microscopic scale have been recognized to play an important role in the field of surface and interface engineering and thin film technologies. The lack of a suitable technique to ... characterize these phenomena forces the development of different approaches how to obtain high spatial resolution with XPS technique. Some of them are described in this article. In more details the new Scanning Photoemission Microscope (SPEM) installed in ESCA Microscopy beamline at synhroton Elettra is presented. Some typical results obtained by small spot XPS technique are given at the end.
    Vir: Vakuumist : glasilo Društva za vakuumsko tehniko Slovenije. - ISSN 0351-9716 (Letn. 18, št. 2, jun. 1998, str. 4-11)
    Vrsta gradiva - članek, sestavni del
    Leto - 1998
    Jezik - slovenski
    COBISS.SI-ID - 13499687

    Povezava(-e):

    Digitalna knjižnica Slovenije - dLib.si

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