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  • Measurements of strain fields due to nanoscale precipitates using the phase image method
    Donnadieu, Patricia ...
    Owing the phase image method (Hytch, 1998), strain fields can be derived from HREM images. The method is here applied to the nanoscale precipitates responsible for hardening in Aluminum alloys. Since ... the method is a very sensitive one, we have examined the impact of several aspects of the image quality (noise, fluctuations, distortion). The strain field information derived from the HREM image analysis is further introduced in a simulation of the dislocation motion in the matrix.
    Vir: Image analysis & stereology : official journal of the International Society for Stereology. - ISSN 1580-3139 (Vol. 20, no. 3, nov. 2001, str. 213-218)
    Vrsta gradiva - članek, sestavni del
    Leto - 2001
    Jezik - angleški
    COBISS.SI-ID - 16038617

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    Digitalna knjižnica Slovenije - dLib.si

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