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  • Presentation methods of textures measurements = Načini predstavitve teksturnih meritev
    Godec, Matjaž ; Jenko, Monika
    The microstructure of materials is usually described by size coordinates - xyz, reflecting the size, shape and the arrangement of the microstructural elements and by angular coordinates - ▫$\theta$▫1 ... fi ▫$\theta$▫2, which show the texture. Texture is defined as the orientation distribution of crystallites ina polycrystalline material and results from many kinds of anisotropic solid-state process which can affect the material's anisotropic properties. The texture can either be measured grain-by-grain or by diffraction from the crystalline material, with the majority of all texture studies being performed by X-ray diffraction. The function f(g), which describes the volume fraction of grains with a particular orientation g is discussed. In metallic materials the main features of texture are described by using adequate solutions of the three-dimensional orientation distribution function (ODF), which is usually calculated from two-dimensional X-ray pole figures. In the ODF the whole volume fraction of the crystals having a particular orientation is quantitatively described. The interpretation of the full ODF is difficult for a non-specialist and many not always be the most suitable way of presenting the texture; but it does allow the identification of texture fibres, their quantitative analysis, as well as the selective projection and plot of characteristic orientation fibres. Different methods for the presentation of textures are compared and discussed using the development of Goss and cube texture in electrical steel alloyed with Sn and Sb as an example.
    Vir: Materiali in tehnologije = Materials and technology. - ISSN 1580-2949 (Letn. 34, št. 6, nov.-dec. 2000, str. 359-364)
    Vrsta gradiva - članek, sestavni del
    Leto - 2000
    Jezik - angleški
    COBISS.SI-ID - 209503

    Povezava(-e):

    Digitalna knjižnica Slovenije - dLib.si

vir: Materiali in tehnologije = Materials and technology. - ISSN 1580-2949 (Letn. 34, št. 6, nov.-dec. 2000, str. 359-364)

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