Measurement and modeling of silicon heterostructure devices

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Measurement and modeling of silicon heterostructure devices

Type of material - proceedings

Publication and manufacture - Boca Raton ; London ; New York : CRC Press : Taylor & Francis Group, cop. 2008

Language - english

ISBN - 978-1-4200-6692-0

COBISS.SI-ID - 30134789

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Library/institution	City	Acronym	For loan	Other holdings
Central Technological Library of the University of Ljubljana	Ljubljana	CTK	outside loan 1 cop.

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Year	Impact factor		Edition		Category		Classification
Year	JCR	SNIP	JCR	SNIP	JCR	SNIP	JCR	SNIP

Links to authors' personal bibliographies	Links to information on researchers in the SICRIS system
Cressler, John D.

Source: Personal bibliographies and: SICRIS

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