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Built-in test for VLSI : pseudorandom techniquesBardell, Paul H. ; McAnney, William H. ; Savir, Jacob.Type of material - bookPublication and manufacture - New York : Wiley, cop. 1987Language - englishISBN - 0-471-62463-2COBISS.SI-ID - 9001238
Author
Bardell, Paul H. |
McAnney, William H. |
Savir, Jacob.
Topics
Integrated circuits |
Very large scale integration |
Testing |
Circuits intégrés à très grande échelle |
Essais |
integrirana vezja |
digitalna vezja |
elektronika |
preskušanje vezij |
testiranje vezij |
testiranje elektronskih komponent |
odkrivanje napak |
napake |
integrated circuits |
digital testing |
built-in test |
VLSI |
testing |
very large scale integration
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Library/institution |
City | Acronym | For loan | Other holdings |
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Library of Technical Faculties, Maribor | Maribor | KTFMB |
outside loan 1 cop.
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Year | Impact factor | Edition | Category | Classification | ||||
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JCR | SNIP | JCR | SNIP | JCR | SNIP | JCR | SNIP |
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Database name | Field | Year |
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Links to authors' personal bibliographies | Links to information on researchers in the SICRIS system |
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Bardell, Paul H. | ![]() |
McAnney, William H. | ![]() |
Savir, Jacob. | ![]() |
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