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National and University Library, Ljubljana (NUK)

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Proceedings

International Conference on Microelectronics, Devices and Materials (43 ; 2007 ; Bled); Workshop on Electronic Testing (2007 ; Bled)

Type of material - proceedings of conference contributions ; adult, serious

Publication and manufacture - Ljubljana : MIDEM - Society for Microelectronics, Electronic Components and Materials, 2007

Language - english

ISBN - 978-961-91023-7-4

COBISS.SI-ID - 234678016

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Author
International Conference on Microelectronics, Devices and Materials | Workshop on Electronic Testing

Other authors
Trontelj, Janez, ml. | Šorli, Iztok | Novak, Franc, 1950- | Strokovno društvo za mikroelektroniko, elektronske sestavne dele in materiale | Ljubljana

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Call number – location, accession no. ...	Copy status
GS II 626850 glavno skladišče	available - reading room

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Year	Impact factor		Edition		Category		Classification
Year	JCR	SNIP	JCR	SNIP	JCR	SNIP	JCR	SNIP

Links to authors' personal bibliographies	Links to information on researchers in the SICRIS system
Trontelj, Janez, ml.	10476
Šorli, Iztok	01718
Novak, Franc, 1950-	05601

Source: Personal bibliographies and: SICRIS

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