Analysis of thin-film detector structures of amorphous silicon for detection of ultraviolet radiation; Analiza tankoplastnih detektorskih struktur iz amorfnega silicija za detekcijo ultravijoličnega sevanja

National and University Library, Ljubljana (NUK)

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Analysis of thin-film detector structures of amorphous silicon for detection of ultraviolet radiation = Analiza tankoplastnih detektorskih struktur iz amorfnega silicija za detekcijo ultravijoličnega sevanja

Jankovec, Marko

Type of material - scientific monograph ; adult, serious

Edition - 1. izd.

Publication and manufacture - Ljubljana : Fakulteta za elektrotehniko, 2005

Language - slovenian

ISBN - 961-243-004-7

COBISS.SI-ID - 219604992

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Author
Jankovec, Marko

Collection
Selected topics of semiconductor electronics

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Year	Impact factor		Edition		Category		Classification
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Links to authors' personal bibliographies	Links to information on researchers in the SICRIS system
Jankovec, Marko	20184

Source: Personal bibliographies and: SICRIS

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