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  • Investigation on the depend... Investigation on the dependence of degradation rate on hole concentration during boron-oxygen related light-induced degradation in crystalline silicon
    Graf, Alexander; Herguth, Axel; Hahn, Giso AIP advances, 08/2018, Volume: 8, Issue: 8
    Journal Article
    Peer reviewed
    Open access

    Boron-oxygen related light-induced degradation (BO-LID) of effective charge carrier lifetime is one of the major problems for photovoltaics based on oxygen-rich boron-doped wafer substrates. Within ...
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