Poor quality of room-temperature vulcanized silicone rubber (RTV-SIR) coating on insulators, such as damages, inclusions, debonding, uneven or substandard thickness, and so on, seriously deteriorates the external insulation performance and brings potential threats to the safety of power grids. This article proposed a convenient, quantitative, and nondestructive inspection method for room-temperature vulcanized (RTV) coating using multimode features of active infrared thermography (AIT). First, the thermal wave model of RTV coating was established to explain the theoretical basis for defect detection and thickness measurement of RTV coating based on the surface transient temperature field. Typical defects of RTV coating were detected, and the defect identification was enhanced by the statistical reconstructed thermal images. The frequency-domain features and the reciprocal square root of the minimum phase frequency (RSRMPF), which was proved to have a linear relationship with the coating thickness, were extracted from the phase spectrum of transient thermal response to quantitatively characterize the micrometer thickness of RTV coating. Particularly, the frequency aliasing phenomenon in small thickness measurement when the sampling frequency is not high enough was reported. And the genetic algorithm was adopted to implement the transient thermal response fitting to overcome the distortion of the phase spectrum induced by the frequency aliasing to obtain the accurate fitted linear calibration line. It has been demonstrated that AIT would have promising application prospects in industrial-quality inspection of RTV coating.