E-resources
Peer reviewed
Open access
-
Urban, Knut W.; Barthel, Juri; Houben, Lothar; Jia, Chun-Lin; Jin, Lei; Lentzen, Markus; Mi, Shao-Bo; Thust, Andreas; Tillmann, Karsten
Progress in materials science, March 2023, 2023-03-00, Volume: 133Journal Article
Transmission electron microscopy is an indispensable tool in modern materials science. It enables the structure of materials to be studied with high spatial resolution, and thus makes a decisive contribution to the fact that it is now possible to understand the microstructure-related physical and chemical characteristics and to correlate these with the macroscopic materials properties. It was tantamount to a paradigm shift when electron microscopy reached atomic resolution in the late 1990s due to the invention of aberration-corrected electron optics. It is now generally accepted practice to perform picometer-scale measurements and chemical analyses with reference to single atomic units. This review has three objectives. Microscopy in atomic dimensions is applied quantum physics. The consequences of this for practical work and for the understanding and application of the results shall be worked out. Typical applications in materials science will be used to show what can be done with this kind of microscopy and where its limitations lie. In the absence of relevant monographs, the aim is to provide an introduction to this new type of electron microscopy and to enable the reader to access the literature in which special issues are addressed. The paper begins with a brief presentation of the principles of optical aberration correction. It then discusses the fundamentals of atomic imaging and covers typical examples of practical applications to problems in modern materials science. It is emphasized that in atomic-resolution electron microscopy the quantitative interpretation of the images must always be based on the solution of the quantum physical and optical problem on a computer.
Author
Shelf entry
Permalink
- URL:
Impact factor
Access to the JCR database is permitted only to users from Slovenia. Your current IP address is not on the list of IP addresses with access permission, and authentication with the relevant AAI accout is required.
Year | Impact factor | Edition | Category | Classification | ||||
---|---|---|---|---|---|---|---|---|
JCR | SNIP | JCR | SNIP | JCR | SNIP | JCR | SNIP |
Select the library membership card:
If the library membership card is not in the list,
add a new one.
DRS, in which the journal is indexed
Database name | Field | Year |
---|
Links to authors' personal bibliographies | Links to information on researchers in the SICRIS system |
---|
Source: Personal bibliographies
and: SICRIS
The material is available in full text. If you wish to order the material anyway, click the Continue button.