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zadetkov: 15
1.
  • Impact Ionization Coefficie... Impact Ionization Coefficients of Digital Alloy and Random Alloy Al0.85Ga0.15As0.56Sb0.44 in a Wide Electric Field Range
    Guo, Bingtian; Jin, Xiao; Lee, Seunghyun ... Journal of lightwave technology, 2022-July15,-15, Letnik: 40, Številka: 14
    Journal Article
    Recenzirano

    Digital alloy and random alloy Al 0.85 Ga 0.15 As 0.56 Sb 0.44 avalanche photodiodes (APDs) exhibit low excess noise, comparable to Si APDs. Consequently, this material is a promising multiplication ...
Celotno besedilo
Dostopno za: UL
2.
  • Linear Mode Avalanche Photo... Linear Mode Avalanche Photodiodes With Antimonide Multipliers on InP Substrates
    Krishna, Sanjay; Lee, Seunghyun; Kodati, Sri Harsha ... IEEE journal of quantum electronics, 08/2022, Letnik: 58, Številka: 4
    Journal Article
    Recenzirano

    We provide an overview of our progress on the development of linear mode avalanche photodiodes (LmAPDs) on InP substrates using antimony (Sb)-based multipliers for short-wavelength infrared (SWIR) ...
Celotno besedilo
Dostopno za: UL
3.
  • Temperature Dependence of A... Temperature Dependence of Avalanche Breakdown of AlGaAsSb and AlInAsSb Avalanche Photodiodes
    Guo, Bingtian; Ahmed, Sheikh Z.; Xue, Xingjun ... Journal of lightwave technology, 09/2022, Letnik: 40, Številka: 17
    Journal Article
    Recenzirano

    Digital alloy Al 0.85 Ga 0.15 As 0.56 Sb 0.44 , random alloy Al 0.85 Ga 0.15 As 0.56 Sb 0.44 , and random alloy Al 0.79 In 0.21 As 0.74 Sb 0.26 are promising candidates for the multiplication regions ...
Celotno besedilo
Dostopno za: UL
4.
  • Signal and Noise Analysis o... Signal and Noise Analysis of an Open-Circuit Voltage Pixel for Uncooled Infrared Image Sensors
    Fragasse, Roman; Tantawy, Ramy; Smith, Dale ... IEEE transactions on circuits and systems. I, Regular papers, 05/2021, Letnik: 68, Številka: 5
    Journal Article
    Recenzirano

    An imaging pixel unit-cell topology leveraging a photodetector in the forward-bias region is proposed. Connecting the anode of the photodiode to the gate of a NMOS device operating in the ...
Celotno besedilo
Dostopno za: UL
5.
  • InGaAs/AlInAsSb avalanche p... InGaAs/AlInAsSb avalanche photodiodes with low noise and strong temperature stability
    Guo, Bingtian; Schwartz, Mariah; Kodati, Sri H. ... APL photonics, 11/2023, Letnik: 8, Številka: 11
    Journal Article
    Recenzirano
    Odprti dostop

    High-sensitivity avalanche photodiodes (APDs) are used to amplify weak optical signals in a wide range of applications, including telecommunications, data centers, spectroscopy, imaging, light ...
Celotno besedilo
Dostopno za: UL
6.
Celotno besedilo

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7.
Celotno besedilo
Dostopno za: UL
8.
  • Low Excess Noise, High Quantum Efficiency Avalanche Photodiodes for Beyond 2 {\mu}m Wavelength Detection
    Jung, Hyemin; Lee, Seunghyun; Xiao, Jin ... arXiv (Cornell University), 06/2024
    Paper, Journal Article
    Odprti dostop

    The increasing concentration of greenhouse gases, notably CH4 and CO2, has fueled global temperature increases, intensifying concerns regarding the prevailing climate crisis. Effectively monitoring ...
Celotno besedilo
Dostopno za: UL
9.
  • Low-Noise InGaAs/AlInAsSb Avalanche Photodiodes on InP Substrates
    Guo, Bingtian; Schwartz, Mariah; Kodati, Sri H. ... 2023 IEEE Photonics Conference (IPC), 2023-Nov.-12
    Conference Proceeding

    We have demonstrated InGaAs/AlInAsSb separate absorption, charge, and multiplication avalanche photodiodes. The multiplication gain, excess noise, and temperature-dependent dark current have been ...
Celotno besedilo
Dostopno za: UL
10.
  • Side Wall Passivation of LWIR P-type Superlattice Detectors using Atomic Layer Deposition
    Specht, Teressa; Myers, Stephen; Ronningen, Theodore J. ... 2018 IEEE Research and Applications of Photonics In Defense Conference (RAPID), 2018-Aug.
    Conference Proceeding

    This work demonstrates the use of aluminum oxide passivation on the mesa sidewall of long-wave infrared p-type superlattice photodetectors applied by atomic layer deposition. The surface leakage ...
Celotno besedilo
Dostopno za: UL
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zadetkov: 15

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