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zadetkov: 23
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  • Science of Microscopy Science of Microscopy
    Hawkes, Peter W; Spence, John C. H 2007, 2008
    eBook

    "The examination of structure at the microscopic scale, between micrometers and angstrom units, has changed dramatically in recent decades. Many new types of microscopy have emerged, notably the many ...
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  • A pitfall in the calculatio... A pitfall in the calculation of higher order aberrations
    Lencová, Bohumila; Lenc, Michal; Hawkes, Peter W. Ultramicroscopy, 07/2008, Letnik: 108, Številka: 8
    Journal Article
    Recenzirano

    When calculating aberration coefficients of secondary and higher order, there is a danger of misinterpreting the result. An example is given for a homogenous magnetic field and the source of the ...
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  • Principles of electron opti... Principles of electron optics.: (Basic geometrical optics)
    Hawkes, Peter W; Kasper, Erwin 10/2017
    eBook

    Volume one of Principles of Electron Optics: Basic Geometrical Optics, Second Edition, explores the geometrical optics needed to analyze an extremely wide range of instruments: cathode-ray tubes; the ...
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  • Introduction Introduction
    Kasper, Erwin; Hawkes, Peter W Principles of Electron Optics, Volume 1, 2017
    Book Chapter
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  • V. Deflection Systems V. Deflection Systems
    Kasper, Erwin; Hawkes, Peter W Principles of Electron Optics, Volume 1, 2017
    Book Chapter
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