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  • Cleaning of contacts for electronic components
    Contact resistance ▫$R_c of silver alloys AgNiO.10, AgNiO.15 and AgCdO for electronic components, i.e. hermetic relays, depends on mechanical properties and the manufacturing technologies as well as ... on cleaning processes applied before and after assembling into electronic components. The contact force (F_c) measurements of investigated contact materials indicate that the F_{c1-1/3}relation is not fulfilled in the range from 3 to 15 cN. The results of present ivestigation indicate that vacuum outgassed contacts with F_c in the region from 3 to 15 cN additional cleaning process of plasma cleaning is suggested. Conventional methods using chemical solvents like fluorocarbons for cleaning of contacts are due to harmful environment influence forbidden in modern society.$▫
    Vir: Vacuum. - ISSN 0042-207X (Vol. 48, no. 7-9, 1997, str. 779-783)
    Vrsta gradiva - članek, sestavni del
    Leto - 1997
    Jezik - angleški
    COBISS.SI-ID - 18675205

vir: Vacuum. - ISSN 0042-207X (Vol. 48, no. 7-9, 1997, str. 779-783)

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