E-viri
-
Bozzo, R.; Coletti, G.; Gemme, C.; Guastavino, F.; Sciutto, L.
IEEE 1997 Annual Report Conference on Electrical Insulation and Dielectric Phenomena, 1997, Letnik: 2Conference Proceeding
The paper describes how the use of statistical tools and the implementation of neural networks have been jointly exploited to process PD patterns derived from experimental data relevant to electrical treeing phenomena in EPR compounds. We show that the overall output of the proposed analysis method allows us to discriminate between different materials, in which the treeing structures are present. In particular, we present evidence that a NN approach can be successfully adopted to select an appropriate subset of ten parameters (out of 56 different quantities computed applying to the "raw" data statistical tools). Such a subset can then be used as a new input data set to train/test other neural networks with comparable error rates.
Vnos na polico
Trajna povezava
- URL:
Faktor vpliva
Dostop do baze podatkov JCR je dovoljen samo uporabnikom iz Slovenije. Vaš trenutni IP-naslov ni na seznamu dovoljenih za dostop, zato je potrebna avtentikacija z ustreznim računom AAI.
Leto | Faktor vpliva | Izdaja | Kategorija | Razvrstitev | ||||
---|---|---|---|---|---|---|---|---|
JCR | SNIP | JCR | SNIP | JCR | SNIP | JCR | SNIP |
Baze podatkov, v katerih je revija indeksirana
Ime baze podatkov | Področje | Leto |
---|
Povezave do osebnih bibliografij avtorjev | Povezave do podatkov o raziskovalcih v sistemu SICRIS |
---|
Vir: Osebne bibliografije
in: SICRIS
To gradivo vam je dostopno v celotnem besedilu. Če kljub temu želite naročiti gradivo, kliknite gumb Nadaljuj.