E-viri
Recenzirano
Odprti dostop
-
Shen Wang; Carpenter, Douglas A.; DeJager, Adam; DiBella, James A.; Doran, James E.; Fabinski, Robert P.; Garland, Andrew; Johnson, James A.; Yaniga, Ryan
IEEE transactions on electron devices, 01/2016, Letnik: 63, Številka: 1Journal Article
A 47-million-pixel (47Mp) interline charge-coupleddevice (CCD) image sensor, the world's highest resolution interline-transfer CCD, has been developed for industrial, machine vision, and aerial photography applications. The sensor features a 5.5-μm pixel, 16-output low-noise amplifier and a lowsmear, fast-dump gate, horizontal lateral overflow drain, and ON-chip temperature sensor. One challenge to manufacture this large sensor is stitching the sensor with different lithography tools, while still achieving equal or better image performance than its predecessor.
