E-viri
Recenzirano
-
Kobayashi, K.; Kubota, K.; Masuda, M.; Manzawa, Y.; Furuta, J.; Kanda, S.; Onodera, H.
IEEE transactions on nuclear science, 08/2014, Letnik: 61, Številka: 4Journal Article
In this paper, we propose a low-power area-efficient redundant flip-flop for soft errors, called DICE-ACFF. Its structure is based on the reliable DICE (Dual Interlocked storage CEll) and the low-power ACFF (Adaptive-Coupling Flip-Flop). It achieves lower power at lower data-activity. We designed DICE-FF and DICE-ACFF using 65 nm conventional bulk and thin-BOX FD-SOI (Silicon on Thin-BOX, SOTB) processes. Its area is twice as large as the conventional DFF. As for power dissipation, DICE ACFF achieves lower power than the conventional DFF below 20% data activity. When data activity is 0%, its power is half of the DFF. As for soft error rates DICE ACFFs are 1.5x better than conventional DICE FFs based on circuit-level simulations to estimate critical charge. No SEU is observed on the DICE ACFF by α-particle and neutron irradiations on the bulk and SOTB chips. From neutron irradiation results, the soft error rate of the DFF of the SOTB chip is 1/15 compared with that of the bulk chip.
![loading ... loading ...](themes/default/img/ajax-loading.gif)
Vnos na polico
Trajna povezava
- URL:
Faktor vpliva
Dostop do baze podatkov JCR je dovoljen samo uporabnikom iz Slovenije. Vaš trenutni IP-naslov ni na seznamu dovoljenih za dostop, zato je potrebna avtentikacija z ustreznim računom AAI.
Leto | Faktor vpliva | Izdaja | Kategorija | Razvrstitev | ||||
---|---|---|---|---|---|---|---|---|
JCR | SNIP | JCR | SNIP | JCR | SNIP | JCR | SNIP |
Baze podatkov, v katerih je revija indeksirana
Ime baze podatkov | Področje | Leto |
---|
Povezave do osebnih bibliografij avtorjev | Povezave do podatkov o raziskovalcih v sistemu SICRIS |
---|
Vir: Osebne bibliografije
in: SICRIS
To gradivo vam je dostopno v celotnem besedilu. Če kljub temu želite naročiti gradivo, kliknite gumb Nadaljuj.