Characterization of high Tc materials and devices by electron microscopy

Central Technological Library of the University of Ljubljana (CTK)

Characterization of high Tc materials and devices by electron microscopy

Type of material - proceedings

Publication and manufacture - Cambridge [etc.] : Cambridge University Press, cop. 2000

Language - english

ISBN - 0-521-55490-X

COBISS.SI-ID - 22909701

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Central Technological Library of the University of Ljubljana	available - outside loan, loan period: 14 days

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67524 Skladišče IN: 120010166	available - outside loan, loan period: 14 days

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