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hits: 55
11.
  • Resonance effects in Raman ... Resonance effects in Raman scattering of quantum dots formed by the Langmuir-Blodgett method
    Milekhin, A G; Sveshnikova, L L; Duda, T A ... Journal of physics. Conference series, 09/2010, Volume: 245, Issue: 1
    Journal Article
    Peer reviewed
    Open access

    The enhancement of Raman scattering by optical phonon modes in quantum dots was achieved in resonant and surface-enhanced Raman scattering experiments by approaching the laser energy to the energy of ...
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12.
  • Uniaxially strained silicon... Uniaxially strained silicon by wafer bonding and layer transfer
    Himcinschi, C.; Radu, I.; Muster, F. ... Solid-state electronics, 02/2007, Volume: 51, Issue: 2
    Journal Article, Conference Proceeding
    Peer reviewed

    Uniaxial strain on wafer-level was realised by mechanically bending and direct wafer bonding of Si wafers in the bent state followed by thinning one of the Si wafers by the smart-cut process. This ...
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  • Investigation of helium imp... Investigation of helium implantation induced blistering in InP
    Singh, R.; Radu, I.; Scholz, R. ... Journal of luminescence, 12/2006, Volume: 121, Issue: 2
    Journal Article, Conference Proceeding
    Peer reviewed

    Four-inch InP wafers were implanted with 100 keV helium ions with a dose of 5×10 16 cm −2 and subsequently annealed in air in the temperature range of 225–400°C in order to determine the blistering ...
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  • Relaxation of strain in pat... Relaxation of strain in patterned strained silicon investigated by UV Raman spectroscopy
    Himcinschi, C.; Radu, I.; Singh, R. ... Materials science & engineering. B, Solid-state materials for advanced technology, 12/2006, Volume: 135, Issue: 3
    Journal Article
    Peer reviewed

    Tensile strained Si (sSi) layers were epitaxially deposited onto fully relaxed Si 0.78Ge 0.22 (SiGe) epitaxial layers (4 μm) on silicon substrates. Periodic arrays of 150 nm × 150 nm and 150 nm × 750 ...
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  • Etching-back of uniaxially ... Etching-back of uniaxially strained silicon on insulator investigated by spectroscopic ellipsometry
    Himcinschi, C.; Singh, R.; Moutanabbir, O. ... Physica status solidi. A, Applications and materials science, April 2008, Volume: 205, Issue: 4
    Journal Article, Conference Proceeding
    Peer reviewed

    Spectroscopic Ellipsometry was employed to study the etching process of uniaxially strained Si (sSi) layers obtained by direct wafer bonding of Si wafers in a mechanically bent state followed by ...
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  • Modelling absorption and ph... Modelling absorption and photoluminescence of TPD
    Vragović, Igor; Calzado, Eva M.; Díaz García, María A. ... Journal of luminescence, 05/2008, Volume: 128, Issue: 5
    Journal Article, Conference Proceeding
    Peer reviewed

    We analyse the optical spectra of N , N ′ -diphenyl- N , N ′ -bis(3-methyl-phenyl)-( 1 , 1 ′ -biphenyl)- 4 , 4 ′ -diamine (TPD) doped polystyrene films. The aim of the present paper is to give a ...
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  • Spectroscopic ellipsometry ... Spectroscopic ellipsometry study of thin diffusion barriers of TaN and Ta for Cu interconnects in integrated circuits
    Rudra, S.; Wächtler, T.; Friedrich, M. ... Physica status solidi. A, Applications and materials science, 04/2008, Volume: 205, Issue: 4
    Journal Article
    Peer reviewed

    The objective of this work is to study the optical and electrical properties of tantalum nitride and tantalum barrier thin films used against copper diffusion in Si in integrated circuits using ...
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  • Resonant Raman scattering o... Resonant Raman scattering of ZnS, ZnO, and ZnS/ZnO core/shell quantum dots
    Milekhin, A. G.; Yeryukov, N. A.; Sveshnikova, L. L. ... Applied physics. A, Materials science & processing, 05/2012, Volume: 107, Issue: 2
    Journal Article
    Peer reviewed
    Open access

    Resonant Raman scattering by optical phonon modes as well as their overtones was investigated in ZnS and ZnO quantum dots grown by the Langmuir–Blodgett technique. The in situ formation of ZnS/ZnO ...
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