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  • Performance-Power Management Aware State-of - the-Art 5nm FinFET Design(5LPE) with Dual CPP from Mobile to HPC Application
    Jeong, Jaehun; Ko, Young Gun; Son, Kihwang ... 2020 IEEE International Electron Devices Meeting (IEDM), 2020-Dec.-12
    Conference Proceeding

    In this paper, we demonstrate state of the art 5nm technology (5LPE) having co-optimization process for Dual CPP (Critical Poly-Pitch) technology to maximize Product Power-Performance-Area by ...
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