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  • Development of controlled n... Development of controlled nanosphere lithography technology
    Osipov, Artem A; Gagaeva, Alina E; Speshilova, Anastasiya B ... Scientific reports, 02/2023, Volume: 13, Issue: 1
    Journal Article
    Peer reviewed
    Open access

    This work is devoted to the development of nanosphere lithography (NSL) technology, which is a low-cost and efficient method to form nanostructures for nanoelectronics, as well as optoelectronic, ...
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  • Proper-time method for uneq... Proper-time method for unequal masses
    Osipov, A.A. Physics letters. B, 06/2021, Volume: 817
    Journal Article
    Peer reviewed
    Open access

    The result of removing of heavy non-equal mass particles from the theory can be described, at low energy, by the effective action, which is a series in inverse-square powers of the mass. We propose a ...
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  • Miura Type Transform Betwee... Miura Type Transform Between Non-Abelian Volterra and Toda Lattices and Inverse Spectral Problem for Band Operators
    Osipov, A. Russian journal of mathematical physics, 09/2023, Volume: 30, Issue: 3
    Journal Article
    Peer reviewed

    We study a discrete Miura-type transformation between the hierarcies of non-Abelian semi-infinite Volterra (Kac–van Moerbeke) and Toda lattices with operator coefficients in terms of the inverse ...
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  • Fabrication, optical and sc... Fabrication, optical and scintillation properties of transparent YAG:Ce ceramics
    Osipov, V.V.; Ishchenko, A.V.; Shitov, V.A. ... Optical materials, September 2017, 2017-09-00, Volume: 71
    Journal Article
    Peer reviewed

    Highly transparent YAG:Ce ceramics (transmission of 72–82% for 2-mm-thick samples in 550–900 nm wavelength range) were fabricated by solid-state reactive sintering using a mixture of Ce2xY2-2xO3 ...
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  • OES diagnostics as a univer... OES diagnostics as a universal technique to control the Si etching structures profile in ICP
    Osipov, Artem A; Iankevich, Gleb A; Speshilova, Anastasia B ... Scientific reports, 03/2022, Volume: 12, Issue: 1
    Journal Article
    Peer reviewed
    Open access

    In this work, we demonstrate the high efficiency of optical emission spectroscopy to estimate the etching profile of silicon structures in SF /C F /O plasma. The etching profile is evaluated as a ...
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  • Ratios of the light quark m... Ratios of the light quark masses: Cubic curve versus ellipse
    Osipov, A. A. Physical review. D, 7/2024, Volume: 110, Issue: 1
    Journal Article
    Peer reviewed

    The bounds on the light quark masses are obtained by fitting the squares of pseudoscalar meson masses m π 2 and m K 2 to second order in 1 / N c expansion. The result is an algebraic cubic curve ...
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  • Inspection of bulk cargoes ... Inspection of bulk cargoes and liquids by the dual energy method
    Osipov, S.P.; Usachev, E.Ju; Chakhlov, S.V. ... Radiation physics and chemistry (Oxford, England : 1993), December 2020, 2020-12-00, 20201201, Volume: 177
    Journal Article
    Peer reviewed

    A number of issues related to the inspection of large containers with bulk materials and liquids by the dual energy method are considered. A mathematical model of the inspection system has been ...
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