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  • IR and X-ray photoelectron spectroscopy of ▫$V_2O_5$▫, ▫$TiO_2$▫ and V/Ti-oxide sol-gel derived films = Infrardeča in rentgenska fotoelektronska spektroskopija ▫$V_2O_5$▫ in V/Ti-oksidnih sol-gel filmov
    Mandrino, Djordje, 1964-2021 ...
    V/Ti-oxide films were prepared by deep-coating from sols made by mixing of V-oxisopropoxide and Ti-propoxide in V:Ti molar ratio in precursors 3:1, 1;1 and 1:3. Amorphous films were obtained after ... annealing at 300°C (1 h)). IR spectroscopic analysis revealed that V=Ostretching modes appeared at 1020 ▫$cm^{-1}$▫ in the IR spectrum of powder (V:Ti = 1:1). however in the IR spectra of a film with the same molar ratio the bands at 1008 and 914 ▫$cm^{-1}$▫ appeared suggesting the presence of ▫$V^{4+}$▫-O bonds. The new band at 790 ▫$cm^{-1}$▫ signalled the V-O-Ti bridging bonds connection V-O and Ti-O polyhedra. XPS measurements confirmed that initial-state films contained ▫$V^{5+}$▫, ▫$V^{4+}$▫ and ▫$Ti^{4+}$▫ species, but at the film sufrace only ▫$V^{5+}$▫ species existed. Sequential depth analysis of films performed with ▫$Ar^+$▫ sputtering showed that the vanadium is reduced to 3+ oxidation state with progressive exposure while titanium is not affected.
    Source: Kovine zlitine tehnologije = Metals alloys technologies. - ISSN 1318-0010 (Letn. 32, št. 6, 1998, str. 487-492)
    Type of material - article, component part ; adult, serious
    Publish date - 1998
    Language - english
    COBISS.SI-ID - 91562

    Link(s):

    Digitalna knjižnica Slovenije - dLib.si

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