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Kvantitativna analiza mikroposnetkov z odbitimi elektroni kot pomoč pri identifikaciji faz v livnih zlitinah = Quantitative analysis of backscattered electron images as an aid for phase identification in cast alloysZupanič, FrancV livarstvu se pri karakterizaciji mikrostrukture poleg svetlobne mikroskopije najpogosteje uporablja kombinacija vrstične elektronske mikroskopije (SEM) in energijskodisperzijske spektroskopije ... rentgenskih žarkov (EDS). EDS s sodobnimi detektorji omogoča kvalitativno analizo elementov vse od Be do U ter kvantitativno analizo vseh elementov od B naprej. Kljub temu je točnost EDS analize pogosto vprašljiva zaradi neprimerne uporabe pospeševalne napetosti, toka primarnih elektronov, zelo majhne velikosti analiziranih delcev, ipd. S SEM lahko dobimo tudi mikroposnetke z odbitimi elektroni (BSE), ki prav tako nosijo informacijo o kemijski sestavi faz. V zvezi s tem je bila razvita metoda, s katero lahko iz slike odbitih elektronov izluščimo podatke o koeficientu povratnega sipanja, faz, ki so navzoče v mikrostrukturi. Koeficiente povratnega sipanja lahko izračunamo tudi iz rezultatov kvantitativne EDS-analize z uporabo empiričnih enačb in Monte Carlo simulacij. S primerjavo koeficientov povratnega sipanja pridobljenih na dva med seboj povsem neodvisna načina lahko preverimo skladnost rezultatov EDS-analize, s čimer se lahko izognemo številnim napačnimi interpretacijam rezultatov. V nekaterih primerih lahko iz analize slike odbitih elektronov dobimo tudi podatke o koncentraciji elementov, ki jihz EDS-analizo ne moremo detektirati.Source: Livarski vestnik : glasilo Društva livarjev Slovenije. - ISSN 0024-5135 (Letn. 58, 2, 2011, str. 87-97)Type of material - article, component partPublish date - 2011Language - slovenian, englishCOBISS.SI-ID - 15131926
source: Livarski vestnik : glasilo Društva livarjev Slovenije. - ISSN 0024-5135 (Letn. 58, 2, 2011, str. 87-97)
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Zupanič, Franc | 12295 |
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