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Scanning Probe Microscopy [Elektronski vir] : Atomic Scale Engineering by Forces and CurrentsFoster, Adam ; Hofer, WernerType of material - e-book ; adult, seriousPublication and manufacture - New York (NY) : Springer, 2006Language - englishISBN - 978-0-387-37231-0COBISS.SI-ID - 31751941
Link(s):
SpringerLink e-books 2005-2007Celotno besedilo dostopno za uporabnike SpringerLink slovenskega konzorcija neprofitnih institucij: UL, UM, UNG, UP, KI, IJS, OILJ, ZRC SAZU, SBCE, UKCMB, KIS.
Full text accessible to the users of SpringerLink Slovenian Consortium of Non-Profit Institutions UL, UM, UNG, UP, KI, IJS, OILJ, ZRC SAZU, SBCE, UKCMB, KIS.
DOI
Author
Foster, Adam |
Hofer, Werner
Other authors
SpringerLink |
Online service
Collection
NanoScience and Technology
Topics
Materials |
Microscopy |
Molecular structure |
Nanotechnology |
Particles (Nuclear physics) |
Surfaces (Physics) |
Chemistry |
Atomic and Molecular Structure and Spectra |
Biological Microscopy |
Characterization and Evaluation Materials |
Solid State Physics and Spectroscopy |
Surfaces and Interfaces, Thin Films
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