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Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits [Elektronski vir] : 2nd EditionType of material - e-book ; adult, seriousPublication and manufacture - Boston (MA) : Springer, 2007Language - englishISBN - 978-0-387-46547-0COBISS.SI-ID - 32525829
Link(s):
SpringerLink e-books 2005-2007Celotno besedilo dostopno za uporabnike SpringerLink slovenskega konzorcija neprofitnih institucij: UL, UM, UNG, UP, KI, IJS, OILJ, ZRC SAZU, SBCE, UKCMB, KIS.
Full text accessible to the users of SpringerLink Slovenian Consortium of Non-Profit Institutions UL, UM, UNG, UP, KI, IJS, OILJ, ZRC SAZU, SBCE, UKCMB, KIS.
DOI
Other authors
Sachdev, Manoj |
Gyvez, José Pineda de |
SpringerLink |
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Collection
Frontiers in Electronic Testing
Topics
Computer engineering |
Electronics |
Engineering |
Engineering design |
Systems engineering |
Circuits and Systems |
Electronic and Computer Engineering |
Electronics and Microelectronics, Instrumentation
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