Schottkyjeva bariera : moderni pogledi na star problem. 2. del,Transport naboja skozi stik kovina-polprevodnik

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Schottkyjeva bariera : moderni pogledi na star problem. 2. del, Transport naboja skozi stik kovina-polprevodnik

Korošak, Dean ; Cvikl, Bruno

V drugem delu prispevka opisujemo transportne lastnosti stika kovine in polprevodnika. V začetku je podan pregledni opis različnih mehanizmov prenosa naboja v idealni Schottkyjevi diodi. V ... nadaljevanju je opisan transport naboja v neidealnem stiku z vmesno kontrolno plastjo, ki nastane pri nanašanju z metodo CIS. Dodatni transport naboja v takšnih Schottkyjevih heterostrukturah lahko povzroči kontinuum elektronskih stanj, ki se pojavi na meji med urejenim in neurejenim delom polprevodnika. Opisan je vpliv takšnega transporta naboja na tokovno karakteristiko diode.

Source: Vakuumist : glasilo Društva za vakuumsko tehniko Slovenije. - ISSN 0351-9716 (18, št. 3, 1998, str. 13-16)

Type of material - article, component part

Publish date - 1998

Language - slovenian

COBISS.SI-ID - 4173078

Link(s):
Digital Library of the University of Maribor – DLUM
Digitalna knjižnica Slovenije - dLib.si

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source: Vakuumist : glasilo Društva za vakuumsko tehniko Slovenije. - ISSN 0351-9716 (18, št. 3, 1998, str. 13-16)

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Year	Impact factor		Edition		Category		Classification
Year	JCR	SNIP	JCR	SNIP	JCR	SNIP	JCR	SNIP

Links to authors' personal bibliographies	Links to information on researchers in the SICRIS system
Korošak, Dean	15413
Cvikl, Bruno	01048

Source: Personal bibliographies and: SICRIS

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