VLSI test principles and architectures : design for testability

(UM)

VLSI test principles and architectures : design for testability

Type of material - handbook

Publication and manufacture - Amsterdam [etc.] : Elsevier, Morgan Kaufmann Publishers, cop. 2006

Language - english

ISBN - 978-0-12-370597-6; 0-12-370597-5

COBISS.SI-ID - 57616129

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Library	Call number – location, accession no. ...	Copy status
University of Maribor Library	Prosti pristop 2. nad. 621.38 209000	available - outside loan, loan period: 1 months

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Links to authors' personal bibliographies	Links to information on researchers in the SICRIS system
Wang, Laung-Terng

Source: Personal bibliographies and: SICRIS

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