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EXAFS analysis of electrochromic NiO thin films : [lecture]Padežnik Gomilšek, Jana ...Source: Abstracts and list of participants (Str. 18-19)Type of material - conference contributionPublish date - 2000Language - englishCOBISS.SI-ID - 5895446
Author
Padežnik Gomilšek, Jana |
Cerc Korošec, Romana |
Bukovec, Peter |
Kodre, Alojz |
Haack, Nils
Topics
fizika |
elektrokemija |
elektrokromni materiali |
nikljev oksid |
NiO |
tanki filmi |
EXAFS analiza |
physics |
electrochemistry |
electrochromatic materials |
nickel oxide |
NiO |
thin films |
EXAFS analysis
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Year | Impact factor | Edition | Category | Classification | ||||
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JCR | SNIP | JCR | SNIP | JCR | SNIP | JCR | SNIP |
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Database name | Field | Year |
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Links to authors' personal bibliographies | Links to information on researchers in the SICRIS system |
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Padežnik Gomilšek, Jana | 06892 |
Cerc Korošec, Romana | 16256 |
Bukovec, Peter | 03439 |
Kodre, Alojz | 02306 |
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