Resolution of the Dual-Energy Method for Detecting Materials in Radiography

E-resources

Peer reviewed

Resolution of the Dual-Energy Method for Detecting Materials in Radiography

Osadchii, S. M.; Petukhov, A. A.; Dunin, V. B.

Surface investigation, x-ray, synchrotron and neutron techniques, 11/2020, Volume: 14, Issue: 6

Journal Article

The possibility of applying silicon PIN detectors for recording the X-ray quanta in radiography within the energy range of 25–150 keV is considered with implementation of the dual-energy method. An approach for estimating the method’s resolution in determining the composition of materials is proposed. In the case of determining the atomic numbers of six chemical elements for dual-energy pairs, the resolution is quantitatively estimated. Limitations and factors affecting the method resolution are established.

Keep searching

Author

Osadchii, S. M. | Petukhov, A. A. | Dunin, V. B.

Access to the JCR database is permitted only to users from Slovenia. Your current IP address is not on the list of IP addresses with access permission, and authentication with the relevant AAI accout is required.

Year	Impact factor		Edition		Category		Classification
Year	JCR	SNIP	JCR	SNIP	JCR	SNIP	JCR	SNIP

Links to authors' personal bibliographies	Links to information on researchers in the SICRIS system

Source: Personal bibliographies and: SICRIS

Upload image

Shelf entry

Adding material to shelf was successful.

Adding material to shelf failed.

It was not necessary to add the material to the shelf.

Permalink

E-mail

Impact factor

Select the library membership card:

DRS, in which the journal is indexed

Citations

Theme