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  • Graded-gap AlxGa1−x As X-ra...
    Silenas, A.; Pozela, K.; Dapkus, L.; Jasutis, V.; Juciene, V.; Pozela, J.; Smith, K.M.

    Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment, 08/2003, Volume: 509, Issue: 1-3
    Journal Article

    An increase in sensitivity of the graded-gap AlxGa1−xAs/GaAs X-ray detectors is achieved using multiplication of charge generated in a detector body. A thin n-GaAs layer was grown on a narrow-gap side of the AlxGa1−xAs structure. This layer is used as a photoconductor. The multiplication of the charge injected from the graded-gap structure to the photoconductive n-GaAs layer exceeds a few hundred times. This sensitive structure was tested as a detector of single alpha particles (from an 241Am source) .