E-resources
Peer reviewed
-
McMahon, P.J.; Peele, A.G.; Paterson, D.; Lin, J.J.A.; Irving, T.H.K.; McNulty, I.; Nugent, K.A.
Optics communications, 03/2003, Volume: 217, Issue: 1Journal Article
Tomographic X-ray phase reconstructions of an atomic force microscope tip with a spatial resolution of better than 900 nm are presented. The data was acquired using an X-ray energy of 1.83 keV using a zone plate based microscope at a third generation synchrotron, the Advanced Photon Source at the Argonne National Laboratory. The phase tomographic data is quantitatively accurate and we confirm that the deduced refractive index is in agreement with the known properties of the sample. Our results open the way for full 3D imaging of the complex refractive index with sub-micron spatial resolution.
Author
![loading ... loading ...](themes/default/img/ajax-loading.gif)
Shelf entry
Permalink
- URL:
Impact factor
Access to the JCR database is permitted only to users from Slovenia. Your current IP address is not on the list of IP addresses with access permission, and authentication with the relevant AAI accout is required.
Year | Impact factor | Edition | Category | Classification | ||||
---|---|---|---|---|---|---|---|---|
JCR | SNIP | JCR | SNIP | JCR | SNIP | JCR | SNIP |
Select the library membership card:
If the library membership card is not in the list,
add a new one.
DRS, in which the journal is indexed
Database name | Field | Year |
---|
Links to authors' personal bibliographies | Links to information on researchers in the SICRIS system |
---|
Source: Personal bibliographies
and: SICRIS
The material is available in full text. If you wish to order the material anyway, click the Continue button.