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Knjižnica tehniških fakultet, Maribor (KTFMB)
  • Possible manifestation of Wanner-Stark effect in C-U data of ICB deposited Schottky junctions
    Cvikl, Bruno ...
    A model description, for a quantitative understanding of peculiar I-U characteristics of ironized cluster beam, ICB, deposited samples, consistent with the orign of nonideal Schottky junctions excess ... capacitance, is presented. The bias dependent effective density of states as deduced from the interfacial net charges, is considered not to be a manifestation of the Wannier-Stark effect but it may offer an independent, direct, evidence giving support to the well known unified defect model.
    Vir: Proceedings (Str. 167-172)
    Vrsta gradiva - prispevek na konferenci
    Leto - 2001
    Jezik - angleški
    COBISS.SI-ID - 6685974

vir: Proceedings (Str. 167-172)

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