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zadetkov: 27.181
21.
  • CCL4 Inhibition in Atherosc... CCL4 Inhibition in Atherosclerosis: Effects on Plaque Stability, Endothelial Cell Adhesiveness, and Macrophages Activation
    Chang, Ting-Ting; Yang, Hsin-Ying; Chen, Ching ... International journal of molecular sciences, 09/2020, Letnik: 21, Številka: 18
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    Atherosclerosis is an arterial inflammatory disease. The circulating level of the C-C chemokine ligand (CCL4) is increased in atherosclerotic patients. This study aimed to investigate whether CCL4 ...
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22.
  • Intercalation of Metal Ions... Intercalation of Metal Ions into Ti3C2Tx MXene Electrodes for High‐Areal‐Capacitance Microsupercapacitors with Neutral Multivalent Electrolytes
    Li, Shuo; Shi, Qi; Li, Yang ... Advanced functional materials, October 1, 2020, Letnik: 30, Številka: 40
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    Microsupercapacitors (MSCs) with neutral multivalent electrolytes are safer, cheaper, and exhibit higher theoretical energy densities compared with the MSCs with acidic and alkaline electrolytes. ...
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23.
  • Role of human papillomaviru... Role of human papillomavirus status after conization for high‐grade cervical intraepithelial neoplasia
    Huang, Huei‐Jean; Tung, Hsiu‐Jung; Yang, Lan‐Yan ... International journal of cancer, 1 February 2021, Letnik: 148, Številka: 3
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    Human papillomavirus (HPV) is the well‐established etiologic factor for cervical neoplasia. Cervical conization constitutes an effective treatment for high‐grade cervical intraepithelial neoplasia ...
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24.
  • Developments in nanocrystal... Developments in nanocrystal memory
    Chang, Ting-Chang; Jian, Fu-Yen; Chen, Shih-Cheng ... Materials today (Kidlington, England), December 2011, 2011-12-00, 20111201, Letnik: 14, Številka: 12
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    Flash nonvolatile memory has been widely applied in portable electronic products. However, traditional flash memory is expected to reach physical limits as its dimensions are scaled down; the charges ...
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25.
  • Resistive Switching Mechani... Resistive Switching Mechanism of Oxygen-Rich Indium Tin Oxide Resistance Random Access Memory
    Tsung-Ming Tsai; Kuan-Chang Chang; Ting-Chang Chang ... IEEE electron device letters, 2016-April, 2016-4-00, 20160401, Letnik: 37, Številka: 4
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    This letter investigates the double-ended resistive switching characteristics of indium tin oxide (ITO) resistance random access memory (RRAM). Resistive switching can be achieved around both the ...
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26.
  • Analysis of Edge Effect Occ... Analysis of Edge Effect Occurring in Non-Volatile Ferroelectric Transistors
    Yeh, Chien-Hung; Chang, Kai-Chun; Lin, Yun-Hsuan ... IEEE electron device letters, 03/2021, Letnik: 42, Številka: 3
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    This study focuses on the interaction between the oxide layer area of a transistor and its ferroelectric layer area. An experimental comparison of transistor oxide layer area demonstrates that the ...
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27.
  • High-Performance Visible-Bl... High-Performance Visible-Blind Ultraviolet Photodetector Based on IGZO TFT Coupled with p–n Heterojunction
    Yu, Jingjing; Javaid, Kashif; Liang, Lingyan ... ACS applied materials & interfaces, 03/2018, Letnik: 10, Številka: 9
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    A visible-blind ultraviolet (UV) photodetector was designed based on a three-terminal electronic device of thin-film transistor (TFT) coupled with two-terminal p–n junction optoelectronic device, in ...
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28.
  • TDP-43 interacts with amylo... TDP-43 interacts with amyloid-β, inhibits fibrillization, and worsens pathology in a model of Alzheimer's disease
    Shih, Yao-Hsiang; Tu, Ling-Hsien; Chang, Ting-Yu ... Nature communications, 11/2020, Letnik: 11, Številka: 1
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    TDP-43 inclusions are found in many Alzheimer's disease (AD) patients presenting faster disease progression and greater brain atrophy. Previously, we showed full-length TDP-43 forms spherical ...
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29.
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30.
  • Analysis of Breakdown-Volta... Analysis of Breakdown-Voltage Increase on SiC Junction Barrier Schottky Diode Under Negative Bias Stress
    Jin, Fu-Yuan; Chen, Po-Hsun; Hung, Wei-Chun ... IEEE transactions on electron devices, 01/2023, Letnik: 70, Številka: 1
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    In this study, the increment in the breakdown voltage of a SiC junction barrier Schottky (JBS) diode under negative bias stress (NBS) is investigated. However, when the SiC JBS exhibits an increase ...
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zadetkov: 27.181

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