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  • Random Telegraph Noise Degr... Random Telegraph Noise Degradation Caused by Hot Carrier Injection in a 0.8 μm-Pitch 8.3Mpixel Stacked CMOS Image Sensor
    Chao, Calvin Yi-Ping; Wu, Thomas Meng-Hsiu; Yeh, Shang-Fu ... Sensors (Basel, Switzerland), 09/2023, Letnik: 23, Številka: 18
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    In this work, the degradation of the random telegraph noise (RTN) and the threshold voltage (Vt) shift of an 8.3Mpixel stacked CMOS image sensor (CIS) under hot carrier injection (HCI) stress are ...
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