UNI-MB - logo
UMNIK - logo
 

Rezultati iskanja

Osnovno iskanje    Ukazno iskanje   

Trenutno NISTE avtorizirani za dostop do e-virov UM. Za polni dostop se PRIJAVITE.

1 2 3 4 5
zadetkov: 56
11.
  • Identification and analysis... Identification and analysis of a new BJT parametric mismatch phenomenon
    Wils, N.; Tuinhout, H.; Ewert, T. ... Proceedings of the Bipolar/BiCMOS Circuits and Technology Meeting, 2005, 2005
    Conference Proceeding

    In this paper we show that discrepancies that were occasionally observed in the base current mismatch area scaling of a 0.25 /spl mu/m BICMOS technology are due to a new mismatch phenomenon. We ...
Celotno besedilo
12.
  • A novel electrical-mechanical simulation flow to predict stress-induced circuit shifts
    Zaal, J. J. M.; Janssen, J. H. J.; Tuinhout, H. P. ... 2016 17th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE), 04/2016
    Conference Proceeding

    In this paper we present an approach to provide insight in electrical parameter shifts due to mechanical stress by means of mechanical modelling through FEA. A fast assessment of the expected ...
Celotno besedilo
13.
  • Very low frequency noise ch... Very low frequency noise characterization of semiconductor devices using DC parameter analyzers
    Tuinhout, H.; Zegers-van Duijnhoven, Adrie; Heringa, A. 2012 IEEE International Conference on Microelectronic Test Structures, 2012-March
    Conference Proceeding

    This paper discusses in detail how standard bench-top semiconductor parameter analyzers can be used for characterizing low frequency noise of semiconductor devices. We demonstrate that flicker noise ...
Celotno besedilo
14.
  • The floating gate measureme... The floating gate measurement technique for characterization of capacitor matching
    Tuinhout, H.P.; Elzinga, H.; Brugman, J.T.H. ... IEEE transactions on semiconductor manufacturing, 02/1996, Letnik: 9, Številka: 1
    Journal Article, Conference Proceeding
    Recenzirano

    This paper discusses a new method for characterization of matching of capacitors using the so-called floating gate capacitance measurement method. After an introduction of this measurement method, ...
Celotno besedilo
15.
  • A methodology to predict the impact of wafer level chip scale package stress on high-precision circuits
    van Dalen, R.; Tuinhout, H. P.; Stoutjesdijk, M. ... 2015 IEEE International Electron Devices Meeting (IEDM), 12/2015
    Conference Proceeding, Journal Article

    A methodology is presented that allows quantitative prediction of the impact of WLCSP induced mechanical stress on high precision mixed-signal ICs. The simulation flow was tuned using high-resolution ...
Celotno besedilo
16.
  • Parametric mismatch charact... Parametric mismatch characterization for mixed-signal technologies
    Tuinhout, H.; Wils, N. 2009 IEEE Bipolar/BiCMOS Circuits and Technology Meeting, 2009-Oct.
    Conference Proceeding

    Systematic and random parametric mismatches are major performance limiters as well as notorious causes for re-designs of high precision mixed-signal circuits and systems. Therefore it is extremely ...
Celotno besedilo
17.
  • Microsecond pulsed DC match... Microsecond pulsed DC matching measurements on MOSFETs in strong and weak inversion
    Andricciola, P.; Tuinhout, H.; Wils, N. ... 2011 IEEE ICMTS International Conference on Microelectronic Test Structures, 2011-April
    Conference Proceeding
    Odprti dostop

    We present a first successful attempt to use microsecond DC pulses for matching measurements on 65-nm MOS transistors down to low current levels. We demonstrate that the interface states that ...
Celotno besedilo

PDF
18.
  • A new technique for charact... A new technique for characterizing very low frequency noise of bipolar junction transistors
    Tuinhout, H.; Zegers-van Duijnhoven, A.; Mertens, H. ... 2011 IEEE Bipolar/BiCMOS Circuits and Technology Meeting, 2011-Oct.
    Conference Proceeding

    Using time sampled DC measurements from standard bench-top semiconductor parameter analyzers, it proves possible to characterize low frequency noise of BJT's down to sub-mHz frequencies. The new ...
Celotno besedilo
19.
  • High precision on-wafer bac... High precision on-wafer backend capacitor mismatch measurements using a benchtop semiconductor characterization system
    Tuinhout, H.; van Rossem, F.; Wils, N. 2009 IEEE International Conference on Microelectronic Test Structures, 03/2009
    Conference Proceeding

    This paper discusses a sophisticated backend capacitor mismatch characterization technique based on direct capacitance measurements with a standard C-V meter, wafer prober subsite moves to measure ...
Celotno besedilo
20.
  • Influence of STI stress on ... Influence of STI stress on drain current matching in advanced CMOS
    Wils, N.; Tuinhout, H.; Meijer, M. 2008 IEEE International Conference on Microelectronic Test Structures, 2008-March
    Conference Proceeding

    Using a dedicated set of - asymmetrically designed - matched pair test structures and a data analysis technique based on so-called mismatch sweeps, we answer some important questions in the ...
Celotno besedilo
1 2 3 4 5
zadetkov: 56

Nalaganje filtrov