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zadetkov: 25
1.
  • Fabrication and Characteris... Fabrication and Characteristics of a Conductive FeCo@Au Nanowire Alloy for Semiconductor Test Socket Connectors
    Kim, In Yea; Kim, Jong Won; Lee, Byeung Ju ... Materials, 12/2022, Letnik: 16, Številka: 1
    Journal Article
    Recenzirano
    Odprti dostop

    The most promising approach for improving the electrical performance of connectors used in semiconductor test sockets involves increasing their electrical conductivity by incorporating ...
Celotno besedilo
2.
  • Extraction of device S‐para... Extraction of device S‐parameters within board by using a TRL de‐embedding technique
    Hamze, Kassem; Pasquet, Daniel; Descamps, Philippe ... Microwave and optical technology letters, November 2018, 2018-11-00, 20181101, 2018-11-01, Letnik: 60, Številka: 11
    Journal Article
    Recenzirano

    Semiconductor devices are tested within a complex environment including a loadboard and a socket. In this paper, we propose a calibration methodology and a RF de‐embedding technique that allows the ...
Celotno besedilo
3.
  • Mechanical Cycling Reliability Testing of Thermal Interface Materials for Semiconductor Test
    Saums, David L.; Jensen, Tim; Gowans, Carol ... 2019 35th Semiconductor Thermal Measurement, Modeling and Management Symposium (SEMI-THERM), 2019-March
    Conference Proceeding

    The most challenging applications for thermal interface materials where durability and thermal performance are both required is found in the semiconductor test and burn-in market. There are a wide ...
Celotno besedilo
4.
  • Optimal testing strategy in... Optimal testing strategy in semiconductor testing process
    Ko, Sung-Seok; Han, Yong-Hee International journal of advanced manufacturing technology, 06/2015, Letnik: 78, Številka: 9-12
    Journal Article
    Recenzirano

    We present an optimal test resource allocation strategy using uncertainty reduction in an environment where resource capacity changes dynamically according to engineering activity. The dynamics of ...
Celotno besedilo
5.
  • Optimal test capacity alloc... Optimal test capacity allocation in automated high-frequency testing environments
    Han, Yong-Hee; Ko, Sung-Seok International journal of advanced manufacturing technology, 09/2012, Letnik: 62, Številka: 1-4
    Journal Article
    Recenzirano

    This paper discusses characteristics unique in the two-phase high-frequency-testing (HFT) environment in semiconductor manufacturing. We believe this paper is the first to define, formalize, and ...
Celotno besedilo
6.
  • The Use of Software Enginee... The Use of Software Engineering Methods for Efficacious Test Program Creation: A Supportive Evidence Based Case Study
    Vock, Stefan; Escalona, Omar; Turner, Colin ... Journal of electronic testing, 08/2014, Letnik: 30, Številka: 4
    Journal Article
    Recenzirano

    Within the semiconductor manufacturing chain the automated testing steps are coming increasingly into focus. Delivering enhanced functionality per IC is expected, with the costs per die being ...
Celotno besedilo
7.
  • Reinforcement learning base... Reinforcement learning based scheduling in semiconductor final testing
    Zhicong Zhang 2010 IEEE International Conference on Industrial Engineering and Engineering Management, 2010-Dec.
    Conference Proceeding

    Semiconductor test scheduling problem is a variation of reentrant unrelated parallel machine problem considering multiple resources constraints, intricate {product, tester, kit, component} ...
Celotno besedilo
8.
  • Challenges for Semiconducto... Challenges for Semiconductor Test Engineering: A Review Paper
    Vock, Stefan R.; Escalona, Omar J.; Turner, Colin ... Journal of electronic testing, 06/2012, Letnik: 28, Številka: 3
    Journal Article
    Recenzirano

    Today’s economical cycles challenge the test program generation process for semiconductors with regard to productivity, time-to-market, increasing quality requirements and manufacturing robustness, ...
Celotno besedilo
9.
  • A Service Component Model f... A Service Component Model for Semiconductor Test Equipment
    Jeong, Hwa Young; Kim, Yoon Ho Applied Mechanics and Materials, 02/2012, Letnik: 157-158
    Journal Article
    Recenzirano

    Web service is a trend of new technology that it is able to support function to user over the internet. That is, user can operate and process the system, and set up values to the machine using the ...
Celotno besedilo
10.
  • Scheduling of semiconductor... Scheduling of semiconductor test facility via Petri nets and hybrid heuristic search
    Huanxin Henry Xiong; Zhou, MengChu IEEE transactions on semiconductor manufacturing, 08/1998, Letnik: 11, Številka: 3
    Journal Article
    Recenzirano

    This paper proposes and evaluates two Petri net-based hybrid heuristic search strategies and their applications to semiconductor test facility scheduling. To reduce the setup time, such as the time ...
Celotno besedilo
1 2 3
zadetkov: 25

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