Automated quantification of morphology and chemistry from STEM data of individual nanoparticles

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Automated quantification of morphology and chemistry from STEM data of individual nanoparticles

Wang, Y C; Slater, T J A; Rodrigues, T S; Camargo, P H C; Haigh, S J

Journal of physics. Conference series, 09/2017, Letnik: 902, Številka: 1

Journal Article

Two novel automated methods for the determination of surface roughness and chemical distribution in individual nanoparticles are presented and applied to nanoparticles synthesised by the galvanic replacement reaction. The two methodologies apply the determination of circumferential and radial line profiles to determine surface roughness and elemental distribution respectively. The surface roughness analysis provides details on localised changes in roughness in comparison to single measures of circularity. The X-ray spectroscopic concentric ring scan outperforms conventional line scans when elemental distribution approximately possesses a spherical symmetry.

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Wang, Y C | Slater, T J A | Rodrigues, T S | Camargo, P H C | Haigh, S J

Dostop do baze podatkov JCR je dovoljen samo uporabnikom iz Slovenije. Vaš trenutni IP-naslov ni na seznamu dovoljenih za dostop, zato je potrebna avtentikacija z ustreznim računom AAI.

Leto	Faktor vpliva		Izdaja		Kategorija		Razvrstitev
Leto	JCR	SNIP	JCR	SNIP	JCR	SNIP	JCR	SNIP

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