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Chen, Jui-Yuan; Huang, Chun-Wei; Chiu, Chung-Hua; Huang, Yu-Ting; Wu, Wen-Wei
Advanced materials (Weinheim), September 9, 2015, Letnik: 27, Številka: 34Journal Article
The filament in aAu/Ta2O5/Au system is analyzed and determined to be a nanoscaled TaO2−x filament. A shrunken anode localizes the filament formation and the defect boundary leads to faster accumulation of oxygen vacancies. The defect changes the switching domination between electron transport and oxygen‐vacancy migration. The migration of oxygen vacancies limits the filament dynamics, indicating the crucial role played by oxygen defects.
