FMF, Physical, Astronomical and Meteorological Library, Ljubljana (FMFFIZ)
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Refractive index of III-metal-polar and N-polar AlGaN waveguides grown by metal organic chemical vapor depositionRigler, Martin, 1986 ...Optical waveguides of III-metal-polar and N-polar AlGaN are grown on sapphire substrates in order to test their use in integrated optics. The dispersion of the ordinary and extraordinary indices of ... refraction for films with aluminum mole fraction between 0.0 and 0.30 at four discrete wavelengths has been determined by the prism coupling method. The wavelength dependence of the refractive indices is described well by the first-order Sellmeier dispersion formula. The measurements show a small difference in the refractive indices between the two polarities, which is more pronounced at longer wavelengths.Source: Applied physics letters. - ISSN 0003-6951 (Vol. 102, iss. 22, 2013, str. 221106-1-221106-5)Type of material - article, component part ; adult, seriousPublish date - 2013Language - englishCOBISS.SI-ID - 2561124
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Database name | Field | Year |
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Links to authors' personal bibliographies | Links to information on researchers in the SICRIS system |
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Rigler, Martin, 1986 | 33105 |
Zgonik, Marko | 05472 |
Hoffmann, Marc P. | |
Kirste, Ronny | |
Bobea, Milena | |
Collazo, R. | |
Sitar, Zlatko | 05565 |
Mita, Seiji | |
Gerhold, Michael |
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