E-resources
Peer reviewed
-
Li, Jiarun; Qian, Feng; Guo, Chongqing; Wang, Ning; Chen, Zhuoyuan; Wang, Lei
Journal of materials science & technology, 10/2023, Volume: 160Journal Article
•Cu2O under AM1.5 illumination can promote the corrosion of Cu matrix.•The photoinduced corrosion of Cu aroused by Cu2O is detected by SVET.•A method for in-situ determining the photoinduced current is proposed. The electrochemical associated with photoelectrochemical behaviors of Cu electrodeposited with Cu2O layer were investigated in this work. The corrosion of Cu was promoted due to the enhanced anodic and cathodic processes under AM 1.5illumination compared with that in the darkness, especially for the anodic process. The photoinduced corrosion of Cu by Cu2O was detected by Scanning Vibrating Electro Technique (SVET). The effect of Cu2O on the promotion of Cu corrosion under illumination can be ascribed to the narrowed depletion layer in Cu2O under illumination, which facilitates the separation of hole-electron pairs. The resultant holes give rise to the oxidation of the Cu matrix and lead to a promoted corrosion consequently. Besides, a method for in-situ determining the photoinduced current of a semiconductor material is proposed.
Shelf entry
Permalink
- URL:
Impact factor
Access to the JCR database is permitted only to users from Slovenia. Your current IP address is not on the list of IP addresses with access permission, and authentication with the relevant AAI accout is required.
Year | Impact factor | Edition | Category | Classification | ||||
---|---|---|---|---|---|---|---|---|
JCR | SNIP | JCR | SNIP | JCR | SNIP | JCR | SNIP |
Select the library membership card:
If the library membership card is not in the list,
add a new one.
DRS, in which the journal is indexed
Database name | Field | Year |
---|
Links to authors' personal bibliographies | Links to information on researchers in the SICRIS system |
---|
Source: Personal bibliographies
and: SICRIS
The material is available in full text. If you wish to order the material anyway, click the Continue button.