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Zhang, Yan; Wang, Chenlu; Yu, Li; Liu, Guodong; Liang, Aiji; Huang, Jianwei; Nie, Simin; Sun, Xuan; Zhang, Yuxiao; Shen, Bing; Liu, Jing; Weng, Hongming; Zhao, Lingxiao; Chen, Genfu; Jia, Xiaowen; Hu, Cheng; Ding, Ying; Zhao, Wenjuan; Gao, Qiang; Li, Cong; He, Shaolong; Zhao, Lin; Zhang, Fengfeng; Zhang, Shenjin; Yang, Feng; Wang, Zhimin; Peng, Qinjun; Dai, Xi; Fang, Zhong; Xu, Zuyan; Chen, Chuangtian; Zhou, X. J.
Nature communications, 05/2017, Volume: 8, Issue: 1Journal Article
Abstract The topological materials have attracted much attention for their unique electronic structure and peculiar physical properties. ZrTe 5 has host a long-standing puzzle on its anomalous transport properties manifested by its unusual resistivity peak and the reversal of the charge carrier type. It is also predicted that single-layer ZrTe 5 is a two-dimensional topological insulator and there is possibly a topological phase transition in bulk ZrTe 5 . Here we report high-resolution laser-based angle-resolved photoemission measurements on the electronic structure and its detailed temperature evolution of ZrTe 5 . Our results provide direct electronic evidence on the temperature-induced Lifshitz transition, which gives a natural understanding on underlying origin of the resistivity anomaly in ZrTe 5 . In addition, we observe one-dimensional-like electronic features from the edges of the cracked ZrTe 5 samples. Our observations indicate that ZrTe 5 is a weak topological insulator and it exhibits a tendency to become a strong topological insulator when the layer distance is reduced.
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