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Knjižnica tehniških fakultet, Maribor (KTFMB)
  • Analiza površine vlaken z mikroskopijo atomskih sil (AFM)
    Tušek, Lidija ...
    Atomic force microscopy (AFM) is one of the most modern types of microscopy enabling nanoscale imaging of both conducting and insulating surfaces. It was developed by the Nobel prize winners in ... physics, Binning and Rober. Since its invention in 1986, AFM has become useful in industry and laboratory R&D practice. The structue of fibres is very complex. In most cases the morphology of the fibre structure differs from the morphology of the core. AFM gives a 3-D nanoscale image of the surface, thus revealing additional information about the fibrillar structure of fibres. It can also be used for intramolecular and intercolloidal force measurements sensing forces even smaller than 1 nN. In this paper the basic AFM operation is discussed and the topography of PA6 filament is analysed using AFM. The fibrillar structure can be seen at the fibre surface. The smallest detectable fibrils are in the range of about 10 nN in width. They are congregated in larger fibril bundles having up to 1-2 microm in diameter. Cavities and niches vary in width (30-200nm) and shape (round or oblong). They are oriented in the direction of the fibre. The surface of the filament is less furrowed in the direction of the fibre; the difference in height between the highest and the lowest regions alongside is only up to 30 mn and transverse up to 70 nm.
    Vir: Tekstilec : glasilo slovenskih tekstilcev. - ISSN 0351-3386 (Letn. 43, št. 9/10, 2000, str. 343-348)
    Vrsta gradiva - članek, sestavni del
    Leto - 2000
    Jezik - slovenski
    COBISS.SI-ID - 5885718

    Povezava(-e):

    Digitalna knjižnica Univerze v Mariboru – DKUM

vir: Tekstilec : glasilo slovenskih tekstilcev. - ISSN 0351-3386 (Letn. 43, št. 9/10, 2000, str. 343-348)

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