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zadetkov: 55
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  • A novel ppm-precise absolut... A novel ppm-precise absolute calibration method for precision high-voltage dividers
    Rest, O; Winzen, D; Bauer, S ... Metrologia, 08/2019, Letnik: 56, Številka: 4
    Journal Article
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    The most common method to measure direct current high voltage (HV) down to the ppm-level is to use resistive high-voltage dividers. Such devices scale the HV into a range where it can be compared ...
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  • Characterization of silicon... Characterization of silicon drift detectors with electrons for the TRISTAN project
    Mertens, S; Brunst, T; Korzeczek, M ... Journal of physics. G, Nuclear and particle physics, 01/2021, Letnik: 48, Številka: 1
    Journal Article
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    Sterile neutrinos are a minimal extension of the standard model of particle physics. A promising model-independent way to search for sterile neutrinos is via high-precision β-spectroscopy. The ...
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  • Focal-plane detector system... Focal-plane detector system for the KATRIN experiment
    Amsbaugh, J.F.; Barrett, J.; Beglarian, A. ... Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment, 04/2015, Letnik: 778, Številka: C
    Journal Article
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    The focal-plane detector system for the KArlsruhe TRItium Neutrino (KATRIN) experiment consists of a multi-pixel silicon p-i-n-diode array, custom readout electronics, two superconducting solenoid ...
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  • The KATRIN pre-spectrometer... The KATRIN pre-spectrometer at reduced filter energy
    Prall, M; Renschler, P; Glück, F ... New journal of physics, 07/2012, Letnik: 14, Številka: 7
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    The Karlsruhe Tritium Neutrino (KATRIN) experiment will determine the mass of the electron neutrino with a sensitivity of 0.2 eV (90% CL) via a measurement of the β-spectrum of gaseous tritium near ...
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  • Dead layer on silicon p–i–n... Dead layer on silicon p–i–n diode charged-particle detectors
    Wall, B.L.; Amsbaugh, J.F.; Beglarian, A. ... Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment, 04/2014, Letnik: 744
    Journal Article
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    Semiconductor detectors in general have a dead layer at their surfaces that is either a result of natural or induced passivation, or is formed during the process of making a contact. Charged ...
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