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Ryabkov, E. D.; Antropov, A. P.; Zaitsev, N. K.; Yashtulov, N. A.
Moscow University chemistry bulletin, 11/2021, Letnik: 76, Številka: 6Journal Article
Two alternative approaches to measuring the depth of nanoholes (nanopits) formed in metallic aluminum in the process of its high-voltage anodizing are proposed. The first approach consists of the electron microscopic study of a metallic layer section formed by cutting ions with the use of a sputtered protective platinum layer with immediate observation of an array of nanopits. The second (indirect) method consists of manufacturing copper replicas from a metallic aluminum layer with the further electrochemical measurement of the overall surface area of the copper electrode and the calculation of the height of the copper nanobristles. It is shown that both approaches lead to the same results.
