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Wang, Z.; Feng, F.; Zhao, Z.J.; Yan, B.J.; Li, Y.L.; Jiang, Z.T.; Chen, H.; Shi, K.; Han, Z.
Applied surface science, 12/2010, Letnik: 257, Številka: 5Journal Article
Biaxially textured yttria stabilized zirconia (0 0 1) thin films were fabricated on untextured hastelloy substrates by ion beam assisted deposition method. The effects of assisting beam current density J a and sputtering beam current density J s on the textures of the films were studied. The results indicate that as J a or J s increase, both the out-of-plane and the in-plane textures are improved initially, and then degrade. The results can be attributed to anisotropic damage and selective sputtering effect of assisting ions. At the same ion-to-atom arrival ratio r, which is reflected with J a / J s value, lower deposition rate can enhance the biaxial texture.
