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Faktor vpliva za serijsko publikacijo Microelectronics Reliability za leto 2022

Leto 2022
Naslov serijske publikacije Microelectronics Reliability
ISSN 0026-2714
Faktor vpliva 0.787

Uvrstitve Science Edition (SE)

 3104 2508 2504 3107 2208 2213
Condensed Matter Physics Surfaces, Coatings and Films Electronic, Optical and Magnetic Materials Atomic and Molecular Physics, and Optics Electrical and Electronic Engineering Safety, Risk, Reliability and Quality
Uvrstitev 193/422 60/128 131/261 103/205 355/718 91/183
Četrtina 2 2 2 2 2 2
IFx 0.916 0.929 1.064 1.047 1.011 0.921
IFmax 1. četrtine 10.083 12.169 12.169 8.223 11.358 4.106
IFmin 1. četrtine 1.058 1.092 1.137 1.037 1.273 1.407
IFmax 2. četrtine 1.053 1.041 1.112 1.036 1.271 1.396
IFmin 2. četrtine 0.724 0.734 0.787 0.787 0.772 0.780
IFmax 3. četrtine 0.723 0.720 0.786 0.782 0.771 0.778
IFmin 3. četrtine 0.470 0.413 0.489 0.522 0.425 0.381
IFmax 4. četrtine 0.468 0.405 0.488 0.517 0.424 0.378
IFmin 4. četrtine 0.005 0.003 0.017 0.005 0.005 0.006
ID=440855 Kreiran 05.10.2023 SNIP::IZUM
100 a2022cMicroelectronics Reliabilityh10193i335j0.787
110 f0026-2714
200 e0026-2714
300 c3104dCondensed Matter Physicsu193/422x0.916y0.724z1.05302110.08321.05831.05340.72450.72360.47070.46880.005
300 c2508dSurfaces, Coatings and Filmsu60/128x0.929y0.734z1.04102112.16921.09231.04140.73450.72060.41370.40580.003
300 c2504dElectronic, Optical and Magnetic Materialsu131/261x1.064y0.787z1.11202112.16921.13731.11240.78750.78660.48970.48880.017
300 c3107dAtomic and Molecular Physics, and Opticsu103/205x1.047y0.787z1.0360218.22321.03731.03640.78750.78260.52270.51780.005
300 c2208dElectrical and Electronic Engineeringu355/718x1.011y0.772z1.27102111.35821.27331.27140.77250.77160.42570.42480.005
300 c2213dSafety, Risk, Reliability and Qualityu91/183x0.921y0.780z1.3960214.10621.40731.39640.78050.77860.38170.37880.006